Download Application of Cathodoluminescence Imaging to the Study of by Sam Boggs Jr, David Krinsley PDF

By Sam Boggs Jr, David Krinsley

Minerals in sedimentary rocks emit attribute seen luminescence known as cathodoluminescence (CL) while bombarded by means of excessive power electrons. CL emissions might be displayed as color photographs in a cathodoluminescence microscope or as high-resolution monochromatic photos in a scanning electron microscope. this offers details no longer to be had via different strategies at the provenance of the mineral grains in sedimentary rocks, and insights into diagenetic alterations. The booklet, first released in 2006, starts with an simply understood presentation of the basic ideas of CL imaging. this can be by means of an outline and dialogue of the tools utilized in CL imaging, and an in depth account of its purposes to the research of sedimentary rocks. the quantity is a complete, simply understood description of the functions of cathodoluminescence imaging to the examine of sedimentary rocks. it is going to be a tremendous source for educational researchers, pros and complicated graduate scholars in sedimentary geology.

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Extra info for Application of Cathodoluminescence Imaging to the Study of Sedimentary Rocks

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The peaks can be labeled to show the chemical element responsible for the peak. This can be done automatically for all peaks or single peaks may be labeled by clicking on them. For many purposes in CL analysis, determining that a particular element is present (qualitative analysis) is adequate. It is not necessary to know the concentration of that element in the sample. Some EDS systems do permit quantitative analysis of samples if standards are available. 33 Cathodoluminescence imaging Liquid nitrogen dewar Computer/ analyzer Preamplifier Electron beam FET Si (Li) detector X-Rays crystal out Level Pileup TC Bias LN Sample Gain out in Main Power supply amplifier out in Analog to digital converter (ADC) Fig.

Many common minerals are nonconductive; therefore, it is necessary to coat specimens with a thin conductive coating (1–10 nm thick) to prevent charging under electron bombardment (excess beam current must flow from specimen to ground to avoid accumulation of charge). , gold) are used under some circumstances. Two methods are used to apply the coatings, which are carried out in a vacuum chamber filled with a gas such as argon or nitrogen. In the evaporation method, a conductive metal is heated to its vaporization temperature in a high vacuum and the evaporated metal atoms land on the specimen surface.

The difference in the two lies in the incident (or primary) current densities used. , 1987); thus, current density is much higher in dynamic SIMS. Because of the low current densities used in static SIMS, only a very thin surface layer (10–50 A˚) is affected by sputtering and relatively little destruction of the surface layer occurs. Dynamic SIMS is commonly used for measurement of trace elements in minerals. Because of the higher current density used, sputtering penetrates through the thin surface layer to depths of as much as 100 nm.

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